arXiv preprint / math.OC

Time-reliability optimization of multi-pass underfill dispensing sequences on printed circuit boards: a schedule-dependent reliability model solved by a multiset-permutation binary-addition-tree algorithm

作者：Wei-Chang Yeh (National Tsing Hua University) · 会议/期刊：arXiv preprint · 方向：math.OC · 发布日期：2026-10-06

2026-10-06优化算法
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Time-reliability optimization of multi-pass underfill dispensing sequences on printed circuit boards: a schedule-dependent reliability model solved by a multiset-permutation binary-addition-tree algorithm figure
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