arXiv preprint / cs.CV

Label-free cell counting and viability prediction with brightfield imaging and deep learning

作者：Amir Reza Vazifeh, Christian Zeigler, Sornanathan Meyyappan, Richard Jeske, Jason W. Fleischer · 单位：Department of Electrical and Computer Engineering, Princeton University, Princeton, NJ 08544, USA · 会议/期刊：arXiv preprint · 方向：cs.CV · 发布日期：2026-10-08

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