arXiv preprint / cs.CV

Detecting Defects that Matter: An Application-Driven Benchmark for Anomaly Detection in Manufacturing and Retail Logistics (VAND 4.0 Challenge)

作者：Lars Heckler-Kram, Dorian Henning, Ashwin Vaidya, Jan-Hendrik Neudeck, Ulla Scheler, Anton Milan, Samet Akcay, Paula Ramos, Sebastian Höfer · 单位：Technical University of Munich · 会议/期刊：arXiv preprint · 方向：cs.CV · 发布日期：2026-10-06

2026-10-06视觉感知数据集/基准
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