DCM-SAM: Defect-Conditioned Mixture of LoRA Experts for NPU-Deployed AM Defect Segmentation

作者：Md Mushfiqur Rahaman, Md Mahedi Hasan, Imtiaz Ahmed, Srinjoy Das · 单位：Department of Industrial and Management Systems Engineering, School of Mathematical and Data SciencesWest Virginia University, Morgantown, WV, Lane Department of Computer Science & Electrical Engineering · 会议/期刊：arXiv preprint · 方向：cs.CV · 发布日期：2026-10-01